Description
The LTE/LTE-Advanced TDD measurement application is one in a common library of measurement applications for the Keysight modular PXI VSAs, providing standard-based transmitter tests by adding fast one-button RF conformance measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced TDD base station and user equipment devices. The measurement application closely follows the 3GPP standard allowing you to stay on the leading edge of your design and manufacturing challenges. RF transmitter testing Simplify measurement setup with automatic detection of downlink channels and signals. For eNB conformance testing, measurement is simplified by recalling E-TM presets, for each carrier, according to 3GPP TS 36.141 conformance document. Perform measurement on all LTE/LTE-Advanced channel bandwidths with ability to view measured results – of up to 5 CCs for LTE-Advanced- in multiple domains such as resource block, sub-carrier, slot, or symbol. Graphical displays with color coding and marker coupling allows you to search for problems faster and troubleshoot the found problems quicker. Test beyond physical layer by using the transport layer decoding functionality. Troubleshoot transport layer problems and verify the channel encoding is correct by getting access to data at different points in the receiver chain suc h as: demapped, deinterleaved, descrambled, deratematched and decoded data.