Description
B1506A common features
- Wide operation range up to 3 kV/1500 A
- Fully automated fast thermal test from -50 °C to +250 °C
- Automatic power device (semiconductor and component) datasheet creation
- Auto record function to prevent data loss
B1506A IV package features
- Fully automated fast IV measurement (Ron, BV, Leakage, Vth, Vsat, etc) for both package and on-wafer devices
- Narrow IV pulse widths (down to 10 μs) to prevent device self-heating for revealing actual device performance
- Oscilloscope view (Time-domain view) to monitor actual voltage/current pulsed waveforms for accurate measurement
- Scalable configuration to add CV and Qg, to expand current range from 20A to 500 A, 1500 A
B1506A full package features
- All of the IV package features
- Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss, Cies, Coes, Cres) and gate resistance (Rg) at 3kV for package devices
- Gate charge (Qg) curve measurement for package devices
- Power loss (conduction, driving and switching loss) calculation