Description
Keysight Technologies pushes the limits of component measurements with the N7788B Component Analyzer. Its proprietary technology is comparable with the well-known Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring Polarization Mode Dispersion (PMD) or differential group delay (DGD) of optical devices. Keysight’s new single scan technology offers a range of advantages to test a complete set of parameters: DGD/ PMD PDL Power / Loss TE / TM-Loss 2nd-order PMD Principal States of Polarization (PSPs) Jones and Mueller Matrices Designed for the Manufacturing Floor High throughput: A complete analysis across the C and the L band is performed in less than 10 seconds! Software Drivers: A range of software drivers is available for external control of the system. This allows easy integration in common ERP systems. Remote control: Control of the instrument through LAN or via the Internet is supported. This supports automation as well as trouble shooting. Report Generation: Generating PDF reports is supported. The content including layout is configurable by the user. Real time power readout: High throughput measurement of non-connectorized components is supported by providing a real time power readout which enables fiber coupling of the new device. Barcode Scanner: Using Barcode scanner is supported for quick transfer of the DUT serial number.
