Description
The B2201A reduces the cost of test by enabling characterization tests to be automated, with only slight compromise to the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators. Industry Challenges Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Many available switching matrices have inherent limitations. For example, many switching matrices degrade the low-current measurement performance of a semiconductor parameter analyzer and become the weakest link in the measurement chain. A switching matrix with an insufficient number of internal paths cannot support both a 4-terminal, full-Kelvin measurement and a capacitance meter, requiring time-consuming manual cabling changes each time measurement changes from IV to CV. Lastly, when a switching matrix cannot compensate capacitance measurements for the measurement distortion created by path length, results will be inaccurate. Summary Excellent switching matrix performance at an affordable price The B2201A 14ch Low Leakage Switch Mainframe provides exceptional low-current leakage and capacitance measurement performance, without the limitations imposed by alternative solutions. The ability to support 10 fA measurements means that it does not detract significantly from the high-performance of the semiconductor parameter analyzer. This model is priced to provide cost-effective measurement performance for less demanding measurement situations. Inputs are sufficient to support a 4-SMU, full-Kelvin configuration. All 14 inputs correspond to unique internal paths, so all inputs can be used simultaneously. Unlike competitive solutions, capacitance measurement results are not distorted by the inherent error introduced by each channel’s varying path lengths; additionally, the system provides the parameters and algorithms necessary to compensate for such variances. Flexible use is provided by a modular structure that supports 12, 24, 36 or 48 output configurations. The 30 MHz bandwidth supports the use of instruments such as pulse generators. Flexible o perator control is provided by the supplemental LED display and front panel control via keypad or optional light pen. Keep pace with the performance of semiconductor parameter analyzers State-of-the-art semiconductor parameter analyzers have reached new levels of performance. With the ability to support 10 fA measurement resolution, the B2201A Switching Matrix keeps pace with the potential of your semiconductor parameter analyzer without significant compromise in measurement performance. Avoid measurement limitations of multiplexing Avoid delays and time-consuming manual switching with the B2201A’s 14 internal measurement paths. Every input has its own internal path operating concurrently, therefore eliminating limitations caused by multiplexing inputs over shared paths. Accurate capacitance measurements Specifically with capacitance measurement, cable length, which includes the path through the matrix, has a significant impact on measurement results. When using the two BNC inputs that are optimized for capacitance measurement, the B2201A Switching Matrix Mainframe–unlike competitive solutions–corrects for the error introduced by the matrix’s internal path lengths, supplying compensation parameters to enable undistorted measurement results. Features and Benefits Feature Benefit 10 femtoamp resolution current measurement capability Switching matrix does not degrade the measurement performance of the semiconductor parameter analyzer. 8 triaxial and 6 BNC inputs Supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with 4 BNC inputs remaining for future expansion. 14 concurrent internal paths Enables you to use all 8 triaxial inputs and all 6 BNC inputs at the same time. Capacitance measurement compensation feature Corrects for the error introduced by the matrix’s internal path lengths, allowing you to make accurate capacitance measurements through a switching matrix. LED display and front panel control via keypad or optional light pen Enables you to perform off-line debug of your measurement structures by giving a visual indication of the matrix relay status and by enabling you to change the relay status manually. 30 MHz bandwidth You can use instruments such as pulse generators through the B2201A switch. Components B2201A 14ch Low Leakage Switch Mainframe B2211A 14ch Low Leakage Switch Module Key Specifications B2201A Specification Value Number of ports I-V port 8 Triaxial Ports (with Guard) AUX port 6 BNC Ports (2 CV port) Output Channel Triaxial Ports (with Guard), x12, x24, x36, and x48 Configurations Available Number of Slots 4 slots for 48mm height switch module B2211A Specification Value Max Current Rating I-V port 1.0 A AUX port 0.5 A Max Voltage Rating I-V port (Other Ch) 200V I-V port (Common) 300V AUX port (Other Ch) 100V AUX port (Common) 100V Channel Isolation I-V port 5 x 10^13(ohm) AUX port 1 x 10^9(ohm) Offset Current (Supplemental) I-V port 50 fA IM Noise (RMS) (Supplemental) I-V port 5 fA Additional C measurement Error (Supplemental) < ± 1 % + 0.2 pF Band width (at --3dB) 30MHz Settling Time (Supplemental) 2.0 sec at 300 fA Related Keysight Offerings B1500A Semiconductor Device Analyzer 4155C Semiconductor Parameter Analyzer 4156C Precision Semiconductor Paramete r Analyzer B2200A fA Leakage Switch Mainframe E5250A Low-leakage Switch Mainframe E5270B 8-Slot Precision Measurement Mainframe 41000 Series
